Source Imaging Goniometers

Source Imaging Goniometers

Applications

  • SIG-300: Source Imaging Goniometer for near-field model measurement
  • SIG-310: Source Imaging Goniometer for large light source measurement
  • SIG-400: Source Imaging Goniometer for near-field model measurement — optimized for LED measurement applications
  • Radiant Source Models: full near-field descriptions of light sources complete with image data
  • ProSource®: software for analyzing Radiant Source Models and generating highly efficient ray sets for optical design

The industry standard for near-field modeling of light sources

Radiant Imaging Source Imaging Goniometers® are fully automated, computer-controlled goniometric systems that use a PM-1600 Series™ Imaging Colorimeter or photometer to capture a precise model of a light source’s near-field output. The image data and the Radiant Source Model™ (RSM) generated from it provide a complete and precise characterization of the light source output that can be used for design evaluation and imported into any major optical design package to allow accurate design of lighting systems. Several models of the Source Imaging Goniometer are available: the SIG-300™ for general light source measurement, the SIG-310™  for large light source measurement, and the SIG-400™ which is optimized for LED measurement applications.

Better light source models result in better design

The measurement data collected by the SIGs is formatted as a RSM file which contains all of the light source measurement information, including the image data, so the measurement results can be review in detail at any time. In addition, ray sets containing an arbitrary number of rays can be generated by ProSource for export to other optical and illumination system design software package such as ASAP, FRED, LightTools, LucidShape, Opticad, OSLO, SimuLux, SPEOS, TracePro, and Zemax, as well as general file formats. Ray sets generated by ProSource from RSMs are more efficient than random Monte Carlo generated ray sets as they contain equivalent information with only 20% of the number of rays — resulting in faster optical design analysis times with higher accuracy.